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VLSID
2007
IEEE
154views VLSI» more  VLSID 2007»
16 years 6 months ago
Model Based Test Generation for Microprocessor Architecture Validation
Functional validation of microprocessors is growing in complexity in current and future microprocessors. Traditionally, the different components (or validation collaterals) used i...
Sreekumar V. Kodakara, Deepak Mathaikutty, Ajit Di...
SIGMOD
2009
ACM
122views Database» more  SIGMOD 2009»
16 years 6 months ago
Finding min-repros in database software
Testing and debugging database system applications is often challenging and time consuming. A database tester (or DB tester for short) has to detect a problem, determine why it ha...
Nicolas Bruno, Rimma V. Nehme
SIGMOD
2001
ACM
136views Database» more  SIGMOD 2001»
16 years 6 months ago
Selectivity Estimation using Probabilistic Models
Estimating the result size of complex queries that involve selection on multiple attributes and the join of several relations is a difficult but fundamental task in database query...
Lise Getoor, Benjamin Taskar, Daphne Koller
ICCAD
2006
IEEE
152views Hardware» more  ICCAD 2006»
16 years 3 months ago
Performance-oriented statistical parameter reduction of parameterized systems via reduced rank regression
Process variations in modern VLSI technologies are growing in both magnitude and dimensionality. To assess performance variability, complex simulation and performance models param...
Zhuo Feng, Peng Li
COCO
2009
Springer
131views Algorithms» more  COCO 2009»
16 years 1 months ago
A Multi-Round Communication Lower Bound for Gap Hamming and Some Consequences
—The Gap-Hamming-Distance problem arose in the context of proving space lower bounds for a number of key problems in the data stream model. In this problem, Alice and Bob have to...
Joshua Brody, Amit Chakrabarti