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EVOW
2008
Springer
15 years 8 months ago
Evolving an Automatic Defect Classification Tool
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
Assaf Glazer, Moshe Sipper
203
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FORMATS
2008
Springer
15 years 8 months ago
A Framework for Distributing Real-Time Functions
Abstract. The design of critical embedded real-time systems requires high confidence in the architecture and the implemented functionalities. Classically, such functions are suppor...
Frédéric Boniol, Pierre-Emmanuel Hla...
APVIS
2007
15 years 8 months ago
Labeling collinear sites
We consider a map labeling problem, where the sites to be labeled are restricted on a line L. This is quite common e.g. in schematized maps for road or subway networks. Each site ...
Michael A. Bekos, Michael Kaufmann, Antonios Symvo...
BILDMED
2008
138views Algorithms» more  BILDMED 2008»
15 years 8 months ago
Haptic Landmark Positioning and Automatic Landmark Transfer in 4D Lung CT Data
Manual landmark positioning in volumetric image data is a complex task and often results in erroneous landmark positions. The landmark positioning tool presented uses image curvatu...
Matthias Färber, Björn Gawenda, Christia...
BIS
2008
92views Business» more  BIS 2008»
15 years 8 months ago
Structural Detection of Deadlocks in Business Process Models
Abstract. A common task in business process modelling is the verification of process models regarding syntactical and structural errors. While the former might be checked with low ...
Ahmed Awad, Frank Puhlmann