Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
Abstract. The design of critical embedded real-time systems requires high confidence in the architecture and the implemented functionalities. Classically, such functions are suppor...
We consider a map labeling problem, where the sites to be labeled are restricted on a line L. This is quite common e.g. in schematized maps for road or subway networks. Each site ...
Michael A. Bekos, Michael Kaufmann, Antonios Symvo...
Manual landmark positioning in volumetric image data is a complex task and often results in erroneous landmark positions. The landmark positioning tool presented uses image curvatu...
Abstract. A common task in business process modelling is the verification of process models regarding syntactical and structural errors. While the former might be checked with low ...