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ASPDAC
2008
ACM
103views Hardware» more  ASPDAC 2008»
15 years 8 months ago
Reliability-aware design for nanometer-scale devices
Continuous transistor scaling due to improvements in CMOS devices and manufacturing technologies is increasing processor power densities and temperatures; thus, creating challenges...
David Atienza, Giovanni De Micheli, Luca Benini, J...
ECML
2007
Springer
15 years 8 months ago
Sequence Labeling with Reinforcement Learning and Ranking Algorithms
Many problems in areas such as Natural Language Processing, Information Retrieval, or Bioinformatic involve the generic task of sequence labeling. In many cases, the aim is to assi...
Francis Maes, Ludovic Denoyer, Patrick Gallinari
AUSFORENSICS
2004
15 years 8 months ago
Generalising Event Forensics Across Multiple Domains
In cases involving computer related crime, event oriented evidence such as computer event logs, and telephone call records are coming under increased scrutiny. The amount of techn...
Bradley Schatz, George M. Mohay, Andrew Clark
FUIN
2006
128views more  FUIN 2006»
15 years 6 months ago
A Rewriting Framework for Rule-Based Programming Dynamic Applications
In recent years light-weighted formal methods are of growing interest in construction and analysis of complex concurrent software system. A new rule-action based term rewriting fr...
Anatoly E. Doroshenko, Ruslan Shevchenko
JSW
2008
123views more  JSW 2008»
15 years 6 months ago
Component-oriented Reliability Analysis and Optimal Version-upgrade Problems for Open Source Software
The current software development environment has been changing into new development paradigms such as concurrent distributed development environment and the so-called open source p...
Yoshinobu Tamura, Shigeru Yamada