: A test procedure for testing mainly the boundary scan cells, and testing partially the test access port controller in programmable logic devices, and field programmable gate arra...
Bondarenko et al. have recently proposed an extension of the argumentation-theoretic semantics of admissible and preferred arguments, originally proposed for logic programming onl...
This paper presents a new approach for on-chip test pattern generation. The set of test patterns generated by a pseudo-random pattern generator (e.g., an LFSR) is transformed into...
Temporal reasoning is widely used within both Computer Science and A.I. However, the underlying complexity of temporal proof in discrete temporal logics has led to the use of simp...
Defeasible reasoning has been studied extensively in the last two decades and many different and dissimilar approaches are currently on the table. This multitude of ideas has made...