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174
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DAC
2003
ACM
16 years 7 months ago
2003
ACM
Recent advances in tester technology have led to automatic test equipment (ATE) that can operate at up to several hundred MHz. However, system-on-chip (SOC) scan chains typically ...
147
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DAC
2005
ACM
16 years 7 months ago
2005
ACM
Placement migration is the movement of cells within an existing placement to address a variety of post-placement design closure issues, such as timing, routing congestion, signal ...
152
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DAC
2006
ACM
16 years 7 months ago
2006
ACM
Aggressive scaling of technology has an adverse impact on the reliability of VLSI circuits. Apart from increasing transient error susceptibility, the circuits also become more vul...
165
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VLSID
2007
IEEE
16 years 7 months ago
2007
IEEE
Device scaling such as reduced oxide thickness and high electric field has given rise to various reliability concerns. One such growing issue of concern is the degradation of PMOS...
183
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ASPDAC
2006
ACM
16 years 18 days ago
2006
ACM
Abstract— Many of today’s data-intensive applications manipulate disk-resident data sets. As a result, their overall behavior is tightly coupled with their disk performance. Un...