Continuously shrinking feature sizes result in an increasing susceptibility of circuits to transient faults, e.g. due to environmental radiation. Approaches to implement fault tol...
Highly regular, nanodevice based architectures have been proposed to replace pure CMOS based architectures in the emerging post CMOS era. Since bottom-up self-assembly is used to ...
For the tasks of classification, two types of patterns can generate problems: ambiguous patterns and outliers. Furthermore, it is possible to separate classification algorithms in...
Jonathan Milgram, Mohamed Cheriet, Robert Sabourin
Parametric feature-based CAD data exchange is one of the most important open problems in solid modeling. The problem is significant and challenging both scientifically and comme...
Decreasing hardware reliability is expected to impede the exploitation of increasing integration projected by Moore's Law. There is much ongoing research on efficient fault t...
Man-Lap Li, Pradeep Ramachandran, Ulya R. Karpuzcu...