4305 search results - page 76 / 861 » The Test of Time |
153
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ITC
2000
IEEE
15 years 10 months ago
2000
IEEE
A wrapper is a thin shell around the core, that provides the switching between functional, and core-internal and core-external test modes. Together with a test access mechanism (T...
156
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DATE
2005
IEEE
15 years 12 months ago
2005
IEEE
This paper describes two research projects that develop new low-cost techniques for testing devices with multiple high-speed (2 to 5 Gbps) signals. Each project uses commercially ...
207
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VLSID
2010
IEEE
15 years 4 months ago
2010
IEEE
Directed test generation is important for the functional verification of complex system-on-chip designs. SAT based bounded model checking is promising for counterexample generatio...
136
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ATS
2009
IEEE
16 years 1 months ago
2009
IEEE
Diagnostic ATPG has traditionally been used to generate test patterns that distinguish pairs of modeled faults. In this work, we investigate the use of n-distinguishing test sets,...
149
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VLSID
2004
IEEE
16 years 6 months ago
2004
IEEE
The detection of all open defects within 6T SRAM cells is always a challenge due to the significant test time requirements. This paper proposes a new design-for-test (DFT) techniq...