4305 search results - page 366 / 861 » The Test of Time |
183
Voted
ICC
2007
IEEE
16 years 1 months ago
2007
IEEE
—Experimentation with mobile ad hoc network testbeds is preferred to simulations for performing high fidelity testing. But, at the same time, realistic experimentation with larg...
163
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IEEEARES
2006
IEEE
16 years 27 days ago
2006
IEEE
There is an increasing demand for highly reliable systems in the safety conscious climate of today’s world. When a fault does occur there are two desirable outcomes. Firstly, de...
177
Voted
CAD
2000
Springer
15 years 6 months ago
2000
Springer
Very large and geometrically complex scenes, exceeding millions of polygons and hundreds of objects, arise naturally in many areas of interactive computer graphics. Time-critical ...
207
Voted
DATE
2010
IEEE
15 years 12 months ago
2010
IEEE
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...
214
Voted
SBRN
2000
IEEE
15 years 11 months ago
2000
IEEE
This paper proposes a simple methodology to construct an iterative neural network which mimics a given chaotic time series. The methodology uses the Gamma test to identify a suita...