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154
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ICIP
2003
IEEE
16 years 8 months ago
2003
IEEE
A critical step in defect detection for semiconductorprocess is to align a test image against a reference. This includes both spatial alignment and grayscale alignment. For the la...
169
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
Soft error tolerant design becomes more crucial due to exponential increase in the vulnerability of computer systems to soft errors. Accurate estimation of soft error rate (SER), ...
180
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LAWEB
2007
IEEE
16 years 1 months ago
2007
IEEE
We perform a statistical analysis of user’s reaction time to a new discussion thread in online debates on the popular news site Slashdot. First, we show with KolmogorovSmirnov t...
186
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EMMCVPR
2007
Springer
16 years 27 days ago
2007
Springer
Video segmentation requires the partitioning of a series of images into groups that are both spatially coherent and smooth along the time axis. We formulate segmentation as a Bayes...
165
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ECAI
2000
Springer
15 years 11 months ago
2000
Springer
We present a novel approach to plan recognition based on a two-stage paradigm of graph construction and analysis. First, a graph structure called a Goal Graph is constructed to rep...