4305 search results - page 278 / 861 » The Test of Time |
105
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DATE
2007
IEEE
16 years 1 months ago
2007
IEEE
Controlling jitter on a picosecond (or smaller) time scale has become one of the most difficult challenges for testing multi-gigahertz systems. In this paper we present a novel me...
172
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CSCW
2010
ACM
16 years 3 months ago
2010
ACM
API usability tests in the lab are time and resource intensive, thus allowing a relatively small percentage of the API namespace to be evaluated. We describe a group-based usabili...
236
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VTS
2000
IEEE
15 years 11 months ago
2000
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, the power supply transient...
184
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ICASSP
2009
IEEE
16 years 1 months ago
2009
IEEE
The LCD deblurring problem is considered as a simple bounded quadratic programming problem and is solved using conjugate gradient with early stopping criteria to avoid excessive s...
167
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INFORMS
2006
15 years 6 months ago
2006
This paper intends to show that the time needed to solve mixed integer programming problems by branch and bound can be roughly predicted early in the solution process. We construc...