Sciweavers

4305 search results - page 273 / 861
» The Test of Time
Sort
View
SIGCSE
2005
ACM
163views Education» more  SIGCSE 2005»
16 years 7 days ago
Using SeSFJava in teaching introductory network courses
Networking course projects are usually described by an informal specification and a collection of test cases. Students often misunderstand the specification or oversimplify it t...
Tamer Elsharnouby, A. Udaya Shankar
SCHEDULING
2008
97views more  SCHEDULING 2008»
15 years 6 months ago
Effective on-line algorithms for reliable due date quotation and large-scale scheduling
We consider the sequencing of a series of jobs that arrive at a single processor over time. At each job's arrival time, a due date must be quoted for the job, and the job must...
Philip Kaminsky, Zu-Hsu Lee
DFT
1999
IEEE
119views VLSI» more  DFT 1999»
15 years 11 months ago
RAMSES: A Fast Memory Fault Simulator
In this paper, we present a memory fault simulator called the Random Access Memory Simulator for Error Screening (RAMSES). Although it was designed based on some wellknown memory ...
Chi-Feng Wu, Chih-Tsun Huang, Cheng-Wen Wu
STOC
2003
ACM
98views Algorithms» more  STOC 2003»
16 years 7 months ago
A sublinear algorithm for weakly approximating edit distance
We show how to determine whether the edit distance between two given strings is small in sublinear time. Specifically, we present a test which, given two n-character strings A and...
Tugkan Batu, Funda Ergün, Joe Kilian, Avner M...
DATE
2000
IEEE
90views Hardware» more  DATE 2000»
15 years 11 months ago
Cost Reduction and Evaluation of a Temporary Faults Detecting Technique
: IC technologies are approaching the ultimate limits of silicon in terms of channel width, power supply and speed. By approaching these limits, circuits are becoming increasingly ...
Lorena Anghel, Michael Nicolaidis