4305 search results - page 251 / 861 » The Test of Time |
171
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VTS
2007
IEEE
16 years 28 days ago
2007
IEEE
The sensitivity of very deep submicron designs to supply voltage noise is increasing due to higher path delay variations and reduced noise margins with supply noise scaling. The s...
150
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ITC
1996
IEEE
15 years 10 months ago
1996
IEEE
Orthogonal scan paths, which follow the path of the data flow, can be used in data path designs to reduce the test overhead -- area, delay and test application time -- by sharing ...
182
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ITC
1998
IEEE
15 years 11 months ago
1998
IEEE
This paper presents a logic synthesis tool called BETSY (BIST Environment Testable Synthesis) for synthesizing circuits that achieve complete (100%)fault coverage in a user specif...
192
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ET
2010
15 years 4 months ago
2010
This work justifies several quantum gate level fault models and discusses the causal error mechanisms thwarting correct function. A quantum adaptation of the classical test set gen...
184
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VLDB
2002
ACM
15 years 6 months ago
2002
ACM
Abstract. Support vector machines (SVMs) have shown superb performance for text classification tasks. They are accurate, robust, and quick to apply to test instances. Their only po...