4305 search results - page 246 / 861 » The Test of Time |
151
click to vote
ITC
1999
IEEE
15 years 11 months ago
1999
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. The power supply transient signals of an ...
179
click to vote
ECML
2006
Springer
15 years 10 months ago
2006
Springer
Abstract. In contrast to the standard inductive inference setting of predictive machine learning, in real world learning problems often the test instances are already available at ...
170
click to vote
TRECVID
2007
15 years 7 months ago
2007
Shot boundary detection is one of the most fundamental processes in video analysis, and it requires high detection accuracy and high-speed processing. This paper proposes a method...
166
click to vote
HM
2007
Springer
16 years 24 days ago
2007
Springer
This paper deals with the Permutation Flow Shop scheduling problem with the objective of minimizing total flow time, and therefore reducing in-process inventory. A new hybrid meta...
185
click to vote
DATE
2000
IEEE
15 years 11 months ago
2000
IEEE
∗∗ Functional BIST is a promising solution for self-testing complex digital systems at reduced costs in terms of area and performance degradation. The present paper addresses t...