4305 search results - page 230 / 861 » The Test of Time |
184
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ATS
2003
IEEE
15 years 12 months ago
2003
IEEE
We present a framework for high-level design validation using an efficient register-transfer level (RTL) automatic test pattern generator (ATPG). The RTL ATPG generates the test ...
157
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DATE
2006
IEEE
16 years 21 days ago
2006
IEEE
Pseudorandom test techniques are widely used for measuring the impulse response (IR) for linear devices and Volterra kernels for nonlinear devices, especially in the acoustics dom...
143
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IOLTS
2002
IEEE
15 years 11 months ago
2002
IEEE
This paper proposes a new solution for the diagnosis of faults into embedded RAMs, currently under evaluation within STMicroelectronics. The proposed scheme uses dedicated circuit...
151
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DATE
1999
IEEE
15 years 11 months ago
1999
IEEE
The paper introduces the new concept of symmetric transparent BIST for RAMs. This concept allows to skip the signature prediction phase of conventional transparent BIST approaches...
164
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FSTTCS
2009
Springer
16 years 1 months ago
2009
Springer
We study the problem of polynomial identity testing (PIT) for depth 2 arithmetic circuits over matrix algebra. We show that identity testing of depth 3 (ΣΠΣ) arithmetic circuit...