4305 search results - page 199 / 861 » The Test of Time |
171
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ITC
2003
IEEE
15 years 12 months ago
2003
IEEE
An in-circuit diagnostic test structure triggered by a light pulse captures logic states on-chip with picosecond timing accuracy, and the results read out via a scan chain thus pr...
134
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ITC
2000
IEEE
15 years 11 months ago
2000
IEEE
We present the application of a deterministic logic BIST scheme on state-of-the-art industrial circuits. Experimental results show that complete fault coverage can be achieved for...
185
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IPPS
2007
IEEE
16 years 26 days ago
2007
IEEE
Many physical and artificial phenomena can be described by time series. The prediction of such phenomenon could be as complex as interesting. There are many time series forecasti...
154
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HASE
1998
IEEE
15 years 10 months ago
1998
IEEE
Residual defects is one of the most important factors that allow one to decide if a piece of software is ready to be released. In theory, one can find all the defects and count th...
190
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IDA
2003
Springer
15 years 11 months ago
2003
Springer
Abstract. Many examples exist of multivariate time series where dependencies between variables change over time. If these changing dependencies are not taken into account, any mode...