4305 search results - page 197 / 861 » The Test of Time |
175
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SSDBM
2005
IEEE
16 years 4 days ago
2005
IEEE
Recent advancements in sensor technology have made it possible to collect enormous amounts of data in real time. However, because of the sheer volume of data most of it will never...
167
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ITC
2000
IEEE
15 years 10 months ago
2000
IEEE
1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
157
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COR
2007
15 years 6 months ago
2007
Minimizing Waiting Time Variance (WTV) is a job scheduling problem where we schedule a batch of n jobs, for servicing on a single resource, in such a way that the variance of thei...
130
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DATE
2007
IEEE
16 years 28 days ago
2007
IEEE
Cost effective SOC test strongly hinges on parallel, independent test of SOC cores, which can only be ensured through proper core isolation techniques. While a core isolation mech...
189
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
Statistical static timing analysis (SSTA) has become a key method for analyzing the effect of process variation in aggressively scaled CMOS technologies. Much research has focused...