Sciweavers

4305 search results - page 181 / 861
» The Test of Time
Sort
View
ITC
2003
IEEE
106views Hardware» more  ITC 2003»
15 years 11 months ago
Detection of Resistive Shorts in Deep Sub-micron Technologies
Current-based tests are the most effective methods available to detect resistive shorts. Delta IDDQ testing is the most sensitive variant and can handle off-state currents of 10-1...
Bram Kruseman, Stefan van den Oetelaar
160
Voted
FORTE
1997
15 years 8 months ago
On-Line Timed Protocol Trace Analysis Based on Uncertain State Descriptions
This paper presents a new approach to the task of passive protocol tracing. The method called FollowSM for the first time meets all requirements of practical in-field use, inclu...
Marek Musial
FOCS
1992
IEEE
15 years 10 months ago
Computing in Solvable Matrix Groups
We announce methods for e cient management of solvable matrix groups over nite elds. We show that solvability and nilpotence can be tested in polynomial-time. Such e ciency seems ...
Eugene M. Luks
159
Voted
CAV
2003
Springer
145views Hardware» more  CAV 2003»
15 years 11 months ago
Monitoring Temporal Rules Combined with Time Series
Run-time monitoring of temporal properties and assertions is used for testing and as a component of execution-based model checking techniques. Traditional run-time monitoring howev...
Doron Drusinsky
DATE
2002
IEEE
102views Hardware» more  DATE 2002»
15 years 11 months ago
Library Compatible Ceff for Gate-Level Timing
Accurate gate-level static timing analysis in the presence of RC loads has become an important problem for modern deep-submicron designs. Non-capacitive loads are usually analyzed...
Bernard N. Sheehan