4305 search results - page 178 / 861 » The Test of Time |
204
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JMLR
2012
13 years 9 months ago
2012
In many settings, data is collected as multiple time series, where each recorded time series is an observation of some underlying dynamical process of interest. These observations...
167
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ADMA
2006
Springer
16 years 16 days ago
2006
Springer
We propose a new algorithm called SCD for learning the structure of a Bayesian network. The algorithm is a kind of constraintbased algorithm. By taking advantage of variable orderi...
183
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VLSID
2001
IEEE
16 years 7 months ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
181
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ENTCS
2006
15 years 6 months ago
2006
In this paper, we study several linear-time equivalences (Markovian trace equivalence, failure and ready trace equivalence) for continuous-time Markov chains that refer to the pro...
150
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ICDAR
2009
IEEE
16 years 1 months ago
2009
IEEE
Classifier combination is a powerful strategy to support useful solutions in difficult classification problems. Notwithstanding, the effectiveness of a multi-classifier system str...