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CONSTRAINTS
2007
15 years 6 months ago
2007
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
176
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ISSTA
2010
ACM
15 years 10 months ago
2010
ACM
When developers change a program, regression tests can fail not only due to faults in the program but also due to outof-date test code that does not reflect the desired behavior ...
178
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ISSTA
2000
ACM
15 years 11 months ago
2000
ACM
Increasing numbers of software developers are using the Unified Modeling Language (UML) and associated visual modeling tools as a basis for the design and implementation of their ...
152
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EDCC
1999
Springer
15 years 10 months ago
1999
Springer
Abstract. The paper presents a new approach to transparent BIST for wordoriented RAMs which is based on the transformation of March transparent test algorithms to the symmetric ver...
177
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FORTE
2003
15 years 7 months ago
2003
The aim of passive testing is to detect faults in a system while observing the system during normal operation, that is, without forcing the system to specialized inputs explicitly ...