4305 search results - page 144 / 861 » The Test of Time |
171
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ISSRE
2006
IEEE
16 years 15 days ago
2006
IEEE
A Java monitor is a Java class that defines one or more synchronized methods. Unlike a regular object, a Java monitor object is intended to be accessed by multiple threads simulta...
158
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ATS
2000
IEEE
15 years 11 months ago
2000
IEEE
We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...
186
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EURODAC
1994
IEEE
15 years 10 months ago
1994
IEEE
This paper presents Resist, a recursive test pattern generation (TPG) algorithm for path delay fault testing of scan-based circuits. In contrast to other approaches, it exploits t...
209
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UAI
2003
15 years 7 months ago
2003
This paper considers a method that combines ideas from Bayesian learning, Bayesian network inference, and classical hypothesis testing to produce a more reliable and robust test o...
222
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SIGSOFT
2010
ACM
15 years 4 months ago
2010
ACM
This article proposes a research agenda aimed at enabling optimized testing and analysis processes and tools to support component-based software development communities. We hypoth...