968 search results - page 179 / 194 » The Rational Unified Process |
190
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HPCA
2006
IEEE
16 years 6 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
262
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SIGMOD
2008
ACM
16 years 6 months ago
2008
ACM
Supporting ranking queries in database systems has been a popular research topic recently. However, there is a lack of study on supporting ranking queries in data warehouses where...
153
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SIGMOD
2001
ACM
16 years 6 months ago
2001
ACM
Estimating the result size of complex queries that involve selection on multiple attributes and the join of several relations is a difficult but fundamental task in database query...
144
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ICFP
2006
ACM
16 years 6 months ago
2006
ACM
The problem of expressing I/O and side effects in functional languages is a well-established one. This paper addresses this problem from a general semantic viewpoint by giving a u...
153
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ICDT
2010
ACM
16 years 3 months ago
2010
ACM
Sources of data uncertainty and imprecision are numerous. A way to handle this uncertainty is to associate probabilistic annotations to data. Many such probabilistic database mode...