3806 search results - page 496 / 762 » The Power of Process |
223
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MICRO
2008
IEEE
16 years 1 months ago
2008
IEEE
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...
186
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DSN
2007
IEEE
16 years 29 days ago
2007
IEEE
Aggressive CMOS scaling will make future chip multiprocessors (CMPs) increasingly susceptible to transient faults, hard errors, manufacturing defects, and process variations. Exis...
175
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SP
2007
IEEE
16 years 26 days ago
2007
IEEE
Hardware manufacturers are increasingly outsourcing their IC fabrication work overseas due to much lower costs. This poses a significant security risk for ICs used for critical m...
180
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IROS
2006
IEEE
16 years 19 days ago
2006
IEEE
— This paper presents a robot audition system that recognizes simultaneous speech in the real world by using robotembedded microphones. We have previously reported Missing Featur...
171
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IPSN
2004
Springer
15 years 12 months ago
2004
Springer
Due to constraints in cost, power, and communication, losses often arise in large sensor networks. The sensor can be modeled as an output of a linear stochastic system with random...