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ICCD
2004
IEEE
128views Hardware» more  ICCD 2004»
16 years 3 months ago
Static Transition Probability Analysis Under Uncertainty
Deterministic gate delay models have been widely used to find the transition probabilities at the nodes of a circuit for calculating the power dissipation. However, with progress...
Siddharth Garg, Siddharth Tata, Ravishankar Arunac...
JCP
2008
105views more  JCP 2008»
15 years 6 months ago
Thermal Driven Placement for Island-style MTCMOS FPGAs
Rapid increase in transistor density and operating frequency has led to the increase in power densities, exhibiting itself as a high temperature profile. The high temperature spots...
Javid Jaffari, Mohab Anis
TVLSI
2008
197views more  TVLSI 2008»
15 years 6 months ago
Leakage Minimization of SRAM Cells in a Dual-Vt and Dual-Tox Technology
-- Aggressive CMOS scaling results in low threshold voltage and thin oxide thickness for transistors manufactured in deep submicron regime. As a result, reducing the subthreshold a...
Behnam Amelifard, Farzan Fallah, Massoud Pedram
DATE
2006
IEEE
120views Hardware» more  DATE 2006»
16 years 19 days ago
Design and test of fixed-point multimedia co-processor for mobile applications
: In this research, a fixed-point multimedia co-processor is designed and tested into an ARM-10 based mobile graphics processor for portable 2-D and 3-D multimedia applications. Th...
Ju-Ho Sohn, Jeong-Ho Woo, Jerald Yoo, Hoi-Jun Yoo
ASPDAC
2008
ACM
119views Hardware» more  ASPDAC 2008»
15 years 8 months ago
A stochastic local hot spot alerting technique
- With the increasing levels of variability in the behavior of manufactured nano-scale devices and dramatic changes in the power density on a chip, timely identification of hot spo...
Hwisung Jung, Massoud Pedram