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ICCAD
2006
IEEE
95views Hardware» more  ICCAD 2006»
16 years 3 months ago
Robust estimation of parametric yield under limited descriptions of uncertainty
Reliable prediction of parametric yield for a specific design is difficult; a significant reason is the reliance of the yield estimation methods on the hard-to-measure distributio...
Wei-Shen Wang, Michael Orshansky
ICCAD
2001
IEEE
107views Hardware» more  ICCAD 2001»
16 years 3 months ago
Fast 3-D Inductance Extraction in Lossy Multi-Layer Substrate
A mixed potential integral equation (MPIE) technique combined with fast multi-layer Green’s functions and Gaussian Jacobi high order techniques is used to compute the 3-D freque...
Minqing Liu, Tiejun Yu, Wayne Wei-Ming Dai
CVPR
2010
IEEE
16 years 2 months ago
3D Shape Scanning with a Time-of-Flight Camera
We describe a method for 3D object scanning by aligning depth scans that were taken from around an object with a time-of-flight camera. These ToF cameras can measure depth scans ...
Christian Theobalt, Yan Cui, Sebastian Schuon, Seb...
PPOPP
2009
ACM
16 years 1 months ago
NePalTM: design and implementation of nested parallelism for transactional memory systems
Abstract. Transactional memory (TM) promises to simplify construction of parallel applications by allowing programmers to reason about interactions between concurrently executing c...
Haris Volos, Adam Welc, Ali-Reza Adl-Tabatabai, Ta...
SC
2009
ACM
16 years 1 months ago
Lessons learned from a year's worth of benchmarks of large data clouds
In this paper, we discuss some of the lessons that we have learned working with the Hadoop and Sector/Sphere systems. Both of these systems are cloud-based systems designed to sup...
Yunhong Gu, Robert L. Grossman