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ISCAS
2006
IEEE
162views Hardware» more  ISCAS 2006»
16 years 26 days ago
Combined image signal processing for CMOS image sensors
This paper presents an efficient image signal processing structure for CMOS image sensors to achieve low area and power consumption. Although CMOS image sensors (CISs) have variou...
Kimo Kim, In-Cheol Park
ISCAS
2006
IEEE
79views Hardware» more  ISCAS 2006»
16 years 26 days ago
A low-power 64-point FFT/IFFT design for IEEE 802.11a WLAN application
—In this paper, we propose a cost-effective and low-power 64-point fast Fourier transform (FFT)/inverse FFT (IFFT) architecture and chip adopting the retrenched 8-point FFT/IFFT ...
Chin-Teng Lin, Yuan-Chu Yu, Lan-Da Van
MTDT
2006
IEEE
154views Hardware» more  MTDT 2006»
16 years 26 days ago
SRAM Cell Current in Low Leakage Design
This paper highlights the cell current characterization of a low leakage 6T SRAM by adjusting the threshold voltages of the transistors in the memory array to reduce the standby p...
Ding-Ming Kwai, Ching-Hua Hsiao, Chung-Ping Kuo, C...
VTS
2006
IEEE
133views Hardware» more  VTS 2006»
16 years 25 days ago
PEAKASO: Peak-Temperature Aware Scan-Vector Optimization
— In this paper, an algorithm for scan vector ordering, PEAKASO, is proposed to minimize the peak temperature during scan testing. Given a circuit with scan and the scan vectors,...
Minsik Cho, David Z. Pan
DATE
2005
IEEE
127views Hardware» more  DATE 2005»
16 years 14 days ago
A Novel Low-overhead Delay Testing Technique for Arbitrary Two-Pattern Test Application
— With increasing process fluctuations in nano-scale technology, testing for delay faults is becoming essential in manufacturing test to complement stuck-at-fault testing. Desig...
Swarup Bhunia, Hamid Mahmoodi-Meimand, Arijit Rayc...