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ISCAS
2007
IEEE
103views Hardware» more  ISCAS 2007»
16 years 24 days ago
Multi-Vth Level Conversion Circuits for Multi-VDD Systems
— Employing multiple supply voltages (multi-VDD) is attractive for reducing the power consumption without sacrificing the speed of an integrated circuit (IC). In order to transfe...
Sherif A. Tawfik, Volkan Kursun
CIVR
2004
Springer
111views Image Analysis» more  CIVR 2004»
15 years 12 months ago
An Inference Network Approach to Image Retrieval
Most image retrieval systems only allow a fragment of text or an example image as a query. Most users have more complex information needs that are not easily expressed in either of...
Donald Metzler, R. Manmatha
LFCS
1992
Springer
15 years 10 months ago
Machine Learning of Higher Order Programs
A generator program for a computable function (by definition) generates an infinite sequence of programs all but finitely many of which compute that function. Machine learning of ...
Ganesh Baliga, John Case, Sanjay Jain, Mandayam Su...
ICCAD
2003
IEEE
159views Hardware» more  ICCAD 2003»
16 years 3 months ago
Energy-Aware Fault Tolerance in Fixed-Priority Real-Time Embedded Systems
We investigate an integrated approach to fault tolerance and dynamic power management in real-time embedded systems. Fault tolerance is achieved via checkpointing and power manage...
Ying Zhang, Krishnendu Chakrabarty, Vishnu Swamina...
DATE
2008
IEEE
86views Hardware» more  DATE 2008»
16 years 1 months ago
Test Scheduling for Wafer-Level Test-During-Burn-In of Core-Based SoCs
Abstract—Wafer-level test during burn-in (WLTBI) has recently emerged as a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, the testi...
Sudarshan Bahukudumbi, Krishnendu Chakrabarty, Ric...