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ETS
2009
IEEE
99views Hardware» more  ETS 2009»
15 years 4 months ago
On Minimization of Peak Power for Scan Circuit during Test
Scan circuit generally causes excessive switching activity compared to normal circuit operation. The higher switching activity in turn causes higher peak power supply current whic...
Jaynarayan T. Tudu, Erik Larsson, Virendra Singh, ...
ICCAD
2010
IEEE
133views Hardware» more  ICCAD 2010»
15 years 3 months ago
Testing methods for detecting stuck-open power switches in coarse-grain MTCMOS designs
Coarse-grain multi-threshold CMOS (MTCMOS) is an effective power-gating technique to reduce IC's leakage power consumption by turning off idle devices with MTCMOS power switc...
Szu-Pang Mu, Yi-Ming Wang, Hao-Yu Yang, Mango Chia...
ICS
2010
Tsinghua U.
15 years 4 months ago
Decomposable and responsive power models for multicore processors using performance counters
Abstract—Power modeling based on performance monitoring counters (PMCs) has attracted the interest of many researchers since it become a quick approach to understand and analyse ...
Ramon Bertran, Marc González, Xavier Martor...
CORR
2008
Springer
138views Education» more  CORR 2008»
15 years 6 months ago
On the Capacity of Free-Space Optical Intensity Channels
New upper and lower bounds are presented on the capacity of the free-space optical intensity channel. This channel is characterized by inputs that are nonnegative (representing the...
Amos Lapidoth, Stefan M. Moser, Michele A. Wigger
ISQED
2008
IEEE
150views Hardware» more  ISQED 2008»
16 years 23 days ago
Fundamental Data Retention Limits in SRAM Standby Experimental Results
SRAM leakage power dominates the total power of low duty-cycle applications, e.g., sensor nodes. Accordingly, leakage power reduction during data-retention in SRAM standby is ofte...
Animesh Kumar, Huifang Qin, Prakash Ishwar, Jan M....