5330 search results - page 727 / 1066 » The Performability Tool P'ility |
173
click to vote
ICCD
2004
IEEE
16 years 3 months ago
2004
IEEE
Leakage current is a key factor in IC power consumption even in the active operating mode. We investigate the simultaneous optimization of gate size and threshold voltage to reduc...
176
Voted
ICCD
2004
IEEE
16 years 3 months ago
2004
IEEE
— We propose an automatic test pattern generation (ATPG) framework for combinational threshold networks. The motivation behind this work lies in the fact that many emerging nanot...
165
Voted
ICCD
2003
IEEE
16 years 3 months ago
2003
IEEE
There is currently a huge gap between the two main technologies used to implement custom digital integrated circuit (IC) designs. At one end of the spectrum are field programmable...
162
Voted
ICCAD
2004
IEEE
16 years 3 months ago
2004
IEEE
Instruction set simulators are indispensable tools for the architectural exploration and verification of embedded systems. Different techniques have recently been proposed to spe...
175
click to vote
ICCAD
2004
IEEE
16 years 3 months ago
2004
IEEE
It has been widely recognized that the dynamic range information of an application can be exploited to reduce the datapath bitwidth of either processors or ASICs, and therefore th...