Dynamic-current based test techniques can potentially address the drawbacks of traditional and Iddq test methodologies. The quality of dynamic current based test is degraded by pr...
As the CMOS technology enters the deep submicron design era, the lateral inter-wire coupling capacitance becomes the dominant part of load capacitance and makes RC delay on the bu...
Bus traffic between the graphics subsystem and memory can become a bottleneck when rendering geometrically complex meshes. In this paper, we investigate the use of vertex caching...
Traditional approaches for content-based image querying typically compute a single signature for each image based on color histograms, texture, wavelet transforms etc., and return...
Most current interface designs require that the user focus their attention on them in order to be of value. However, as the price of computation falls, and computational capabilit...
Jeremy M. Heiner, Scott E. Hudson, Kenichiro Tanak...