Sciweavers

16188 search results - page 2776 / 3238
» The Optimal PAC Algorithm
Sort
View
DAC
2010
ACM
15 years 10 months ago
LUT-based FPGA technology mapping for reliability
As device size shrinks to the nanometer range, FPGAs are increasingly prone to manufacturing defects. We anticipate that the ability to tolerate multiple defects will be very impo...
Jason Cong, Kirill Minkovich
ANCS
2006
ACM
15 years 10 months ago
Efficient memory utilization on network processors for deep packet inspection
Deep Packet Inspection (DPI) refers to examining both packet header and payload to look for predefined patterns, which is essential for network security, intrusion detection and c...
Piti Piyachon, Yan Luo
DAC
2004
ACM
15 years 10 months ago
A methodology to improve timing yield in the presence of process variations
The ability to control the variations in IC fabrication process is rapidly diminishing as feature sizes continue towards the sub-100 nm regime. As a result, there is an increasing...
Sreeja Raj, Sarma B. K. Vrudhula, Janet Meiling Wa...
DATE
2004
IEEE
144views Hardware» more  DATE 2004»
15 years 10 months ago
A Framework for Battery-Aware Sensor Management
A distributed sensor network (DSN) designed to cover a given region R, is said to be alive if there is at least one subset of sensors that can collectively cover (sense) the regio...
Sridhar Dasika, Sarma B. K. Vrudhula, Kaviraj Chop...
CIKM
2006
Springer
15 years 10 months ago
Mining compressed commodity workflows from massive RFID data sets
Radio Frequency Identification (RFID) technology is fast becoming a prevalent tool in tracking commodities in supply chain management applications. The movement of commodities thr...
Hector Gonzalez, Jiawei Han, Xiaolei Li
« Prev « First page 2776 / 3238 Last » Next »