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EVOW
2008
Springer
15 years 9 months ago
Evolving an Automatic Defect Classification Tool
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
Assaf Glazer, Moshe Sipper
192
Voted
EWRL
2008
15 years 9 months ago
Regularized Fitted Q-Iteration: Application to Planning
We consider planning in a Markovian decision problem, i.e., the problem of finding a good policy given access to a generative model of the environment. We propose to use fitted Q-i...
Amir Massoud Farahmand, Mohammad Ghavamzadeh, Csab...
FPGA
2008
ACM
191views FPGA» more  FPGA 2008»
15 years 9 months ago
A hardware framework for the fast generation of multiple long-period random number streams
Stochastic simulations and other scientific applications that depend on random numbers are increasingly implemented in a parallelized manner in programmable logic. High-quality ps...
Ishaan L. Dalal, Deian Stefan
ACL
2007
15 years 9 months ago
Learning Predictive Structures for Semantic Role Labeling of NomBank
This paper presents a novel application of Alternating Structure Optimization (ASO) to the task of Semantic Role Labeling (SRL) of noun predicates in NomBank. ASO is a recently pr...
Chang Liu, Hwee Tou Ng
AIPRF
2008
15 years 9 months ago
Internal vs. External Parameters in Fitness Functions
A fitness function is needed for a Genetic Algorithm (GA) to work, and it appears natural that the combination of objectives and constraints into a single scalar function using ar...
Pedro A. Diaz-Gomez, Dean F. Hougen
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