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DATE
2008
IEEE
16 years 24 days ago
2008
IEEE
— In the face of increased process variations, at-speed manufacturing test is necessary to detect subtle delay defects. This procedure necessarily tests chips at a slightly highe...
183
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GLVLSI
2008
IEEE
16 years 24 days ago
2008
IEEE
Novel nano-scale devices have shown promising potential to overcome physical barriers faced by complementary metaloxide semiconductor (CMOS) technology in future circuit design. H...
137
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ICPADS
2008
IEEE
16 years 23 days ago
2008
IEEE
Personal Health (pHealth) sensor networks are generally used to monitor the wellbeing of both athletes and the general public to inform health specialists of future and often seri...
127
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SASO
2008
IEEE
16 years 22 days ago
2008
IEEE
Current solutions for industrial manufacturing assembly systems do not suit the needs of Mass Customization industry, which is facing low production volumes, many variants and rap...
168
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SUTC
2008
IEEE
16 years 22 days ago
2008
IEEE
Semantic understanding of multimedia content has become a very popular research topic in recent years. Semantic concept detection algorithms face many challenges such as the seman...