We address the problem of efficient end-to-end network monitoring of path metrics in communication networks. Our goal is to minimize the number of measurements or monitors requir...
When VLSI technology scales toward 45nm, the lithography wavelength stays at 193nm. This large gap results in strong refractive effects in lithography. Consequently, it is a huge...
An expert finding is a very common task among enterprise search activities, while its usual retrieval performance is far from the quality of the Web search. Query modeling helps t...
This paper presents the sequential evaluation of the question answering system SQuaLIA. This system is based on the same sequential process as most statistical question answering ...
In this paper we present the basic requirements and initial design of a system which manages and facilitates changes to an OWL ontology in a multi-editor environment. This system u...
Timothy Redmond, Michael Smith, Nick Drummond, Tan...