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VLSID
2007
IEEE
130views VLSI» more  VLSID 2007»
16 years 7 months ago
Impact of NBTI on FPGAs
Device scaling such as reduced oxide thickness and high electric field has given rise to various reliability concerns. One such growing issue of concern is the degradation of PMOS...
Krishnan Ramakrishnan, S. Suresh, Narayanan Vijayk...
VLSID
2006
IEEE
121views VLSI» more  VLSID 2006»
16 years 7 months ago
An Integrated Approach for Combining BDD and SAT Provers
Many formal verification tools today are based on Boolean proof techniques. The two most powerful approaches in this context are Binary Decision Diagrams (BDDs) and methods based ...
Rolf Drechsler, Görschwin Fey, Sebastian Kind...
VLSID
2005
IEEE
87views VLSI» more  VLSID 2005»
16 years 7 months ago
Synthesis of Asynchronous Circuits Using Early Data Validity
Interest in asynchronous circuit design is increasing due to its promise of efficient designs. The quiescent nature of asynchronous circuits allows them to remain in a stable stat...
Nitin Gupta, Doug A. Edwards
VLSID
2004
IEEE
120views VLSI» more  VLSID 2004»
16 years 7 months ago
Dynamic Power Optimization of Interactive Systems
Abstract-- Power has become a major concern for mobile computing systems such as laptops and handhelds, on which a significant fraction of software usage is interactive instead of ...
Lin Zhong, Niraj K. Jha
VLSID
2003
IEEE
180views VLSI» more  VLSID 2003»
16 years 7 months ago
Automating Formal Modular Verification of Asynchronous Real-Time Embedded Systems
Most verification tools and methodologies such as model checking, equivalence checking, hardware verification, software verification, and hardware-software coverification often fl...
Pao-Ann Hsiung, Shu-Yu Cheng