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VLSID
2004
IEEE
139views VLSI» more  VLSID 2004»
16 years 6 months ago
Open Defects Detection within 6T SRAM Cells using a No Write Recovery Test Mode
The detection of all open defects within 6T SRAM cells is always a challenge due to the significant test time requirements. This paper proposes a new design-for-test (DFT) techniq...
André Ivanov, Baosheng Wang, Josh Yang
HPCA
2005
IEEE
16 years 6 months ago
A Unified Compressed Memory Hierarchy
The memory system's large and growing contribution to system performance motivates more aggressive approaches to improving its efficiency. We propose and analyze a memory hie...
Erik G. Hallnor, Steven K. Reinhardt
ICCD
2005
IEEE
101views Hardware» more  ICCD 2005»
16 years 3 months ago
Three-Dimensional Cache Design Exploration Using 3DCacti
As technology scales, interconnects dominate the performance and power behavior of deep submicron designs. Three-dimensional integrated circuits (3D ICs) have been proposed as a w...
Yuh-Fang Tsai, Yuan Xie, Narayanan Vijaykrishnan, ...
GLOBECOM
2006
IEEE
16 years 17 days ago
Analysis of the Effect of Mobile Terminal Speed on WLAN/3G Vertical Handovers
— WLAN hot-spots are becoming widely spread. This, combined with the availability of new multi-mode terminals integrating heterogeneous technologies, opens new business opportuni...
Telemaco Melia, Antonio de la Oliva, Ignacio Soto,...
CCGRID
2005
IEEE
16 years 4 days ago
Continuous resources allocation in Internet data centers
Internet data centers (IDCs) perform multi-customer hosting on a virtualized collection of resources while Grid computing generalizes distributed computing by focusing on large sc...
Youssef Hamadi