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DAC
2008
ACM
16 years 7 months ago
Study of the effects of MBUs on the reliability of a 150 nm SRAM device
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
Juan Antonio Maestro, Pedro Reviriego
ICML
1998
IEEE
16 years 7 months ago
An Efficient Boosting Algorithm for Combining Preferences
We study the problem of learning to accurately rank a set of objects by combining a given collection of ranking or preference functions. This problem of combining preferences aris...
Yoav Freund, Raj D. Iyer, Robert E. Schapire, Yora...
SIGSOFT
2004
ACM
16 years 7 months ago
Efficient incremental algorithms for dynamic detection of likely invariants
Dynamic detection of likely invariants is a program analysis that generalizes over observed values to hypothesize program properties. The reported program properties are a set of ...
Jeff H. Perkins, Michael D. Ernst
WWW
2005
ACM
16 years 7 months ago
Debugging OWL ontologies
As an increasingly large number of OWL ontologies become available on the Semantic Web and the descriptions in the ontologies become more complicated, finding the cause of errors ...
Bijan Parsia, Evren Sirin, Aditya Kalyanpur
RECOMB
2009
Springer
16 years 7 months ago
Finding Biologically Accurate Clusterings in Hierarchical Tree Decompositions Using the Variation of Information
Abstract. Hierarchical clustering is a popular method for grouping together similar elements based on a distance measure between them. In many cases, annotation information for som...
Saket Navlakha, James Robert White, Niranjan Nagar...