4107 search results - page 170 / 822 » The Generalized Lambda Test |
181
click to vote
VTS
2000
IEEE
15 years 11 months ago
2000
IEEE
Excessive switching activity during scan testing can cause average power dissipation and peak power during test to be much higher than during normal operation. This can cause prob...
195
click to vote
ITC
1994
IEEE
15 years 10 months ago
1994
IEEE
Previous approaches to designing random pattern testable circuits use post-synthesis test point insertion to eliminate random pattern resistant (r.p.r.) faults. The approach taken...
167
click to vote
EXPCS
2007
15 years 10 months ago
2007
In this paper, we introduce EXACT, the EXperimental Algorithmics Computational Toolkit. EXACT is a software framework for describing, controlling, and analyzing computer experimen...
156
click to vote
ATS
2005
IEEE
15 years 8 months ago
2005
IEEE
Reversibility is of interest in achieving extremely low power dissipation; it is also an inherent design requirement of quantum computation. Logical fault models for conventional ...
157
click to vote
CSDA
2008
15 years 6 months ago
2008
Abstract. To study the relationship between the levels of chemical pollutants and the number of daily total hospital admissions for respiratory diseases and to find the effect of t...