4107 search results - page 156 / 822 » The Generalized Lambda Test |
178
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DATE
2000
IEEE
15 years 11 months ago
2000
IEEE
∗∗ Functional BIST is a promising solution for self-testing complex digital systems at reduced costs in terms of area and performance degradation. The present paper addresses t...
222
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SOFTVIS
2010
ACM
15 years 6 months ago
2010
ACM
Multi-core processors have become increasingly prevalent, driving a software shift toward concurrent programs which best utilize these processors. Testing and debugging concurrent...
167
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ICANN
2005
Springer
16 years 9 hour ago
2005
Springer
A common assumption in supervised learning is that the training and test input points follow the same probability distribution. However, this assumption is not fulfilled, e.g., in...
166
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VTC
2008
IEEE
16 years 26 days ago
2008
IEEE
– This paper presents the realization of the digital block of a hardware simulator of MIMO propagation channels for UMTS and WLAN applications. The hardware simulator must reprod...
135
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GECCO
2005
Springer
16 years 13 hour ago
2005
Springer
We discuss testing methods for exposing origin-seeking bias in PSO motion algorithms. The strategy of resizing the initialization space, proposed by Gehlhaar and Fogel and made po...