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MTDT
2000
IEEE
129views Hardware» more  MTDT 2000»
15 years 10 months ago
Using GLFSRs for Pseudo-Random Memory BIST
In this work, we present the application of Generalized Linear Feedback Shift Registers (GLFSRs) for generation of patterns for pseudo-random memory Built-In SelfTest (BIST). Rece...
Michael Redeker, Markus Rudack, Thomas Lobbe, Dirk...
ISESE
2006
IEEE
16 years 13 days ago
An industrial case study of structural testing applied to safety-critical embedded software
Effective testing of safety-critical real-time embedded software is difficult and expensive. Many companies are hesitant about the cost of formalized criteria-based testing and a...
Jing Guan, Jeff Offutt, Paul Ammann
AOSD
2006
ACM
16 years 11 days ago
A framework and tool supports for generating test inputs of AspectJ programs
Aspect-oriented software development is gaining popularity with the wider adoption of languages such as AspectJ. To reduce the manual effort of testing aspects in AspectJ programs...
Tao Xie, Jianjun Zhao
CORR
2008
Springer
97views Education» more  CORR 2008»
15 years 6 months ago
Lower bounds for adaptive linearity tests
Linearity tests are randomized algorithms which have oracle access to the truth table of some function f, and are supposed to distinguish between linear functions and functions whi...
Shachar Lovett
SIGSOFT
2010
ACM
15 years 4 months ago
Directed test suite augmentation: techniques and tradeoffs
Test suite augmentation techniques are used in regression testing to identify code elements affected by changes and to generate test cases to cover those elements. Our preliminary...
Zhihong Xu, Yunho Kim, Moonzoo Kim, Gregg Rotherme...