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ITC
1995
IEEE
122views Hardware» more  ITC 1995»
15 years 10 months ago
A Fault Model and a Test Method for Analog Fuzzy Logic Circuits
A nalog circuit implementations of fuzzy logic are characterized by performing logical connectives of analog signals. They can be considered as generalization of digital circuits ...
Stefan Weiner
JASIS
2006
120views more  JASIS 2006»
15 years 6 months ago
Building a reusable test collection for question answering
In contrast to traditional information retrieval systems, which return ranked lists of documents that users must manually browse through, a question answering system attempts to d...
Jimmy J. Lin, Boris Katz
SIGIR
2008
ACM
15 years 6 months ago
Ambiguous queries: test collections need more sense
Although there are many papers examining ambiguity in Information Retrieval, this paper shows that there is a whole class of ambiguous word that past research has barely explored....
Mark Sanderson
ECCC
2010
83views more  ECCC 2010»
15 years 5 months ago
Deterministic Identity Testing of Read-Once Algebraic Branching Programs
In this paper we study polynomial identity testing of sums of k read-once algebraic branching programs (Σk-RO-ABPs), generalizing the work of Shpilka and Volkovich [1, 2], who co...
Maurice Jansen, Youming Qiao, Jayalal M. N. Sarma
SIGSOFT
2010
ACM
15 years 4 months ago
Basset: a tool for systematic testing of actor programs
This paper presents Basset, a tool for systematic testing of JVM-based actor programs. The actor programming model offers a promising approach for developing reliable concurrent a...
Steven Lauterburg, Rajesh K. Karmani, Darko Marino...