We propose Satisfiability Checking (SAT) techniques that lead to a consistent performance improvement of up to 3x over state-ofthe-art SAT solvers like Chaff on important problem ...
Malay K. Ganai, Pranav Ashar, Aarti Gupta, Lintao ...
Increasing non-recurring engineering (NRE) and mask costs are making it harder to turn to hardwired Application Specific Integrated Circuit (ASIC) solutions for high performance a...
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...
The next generation of computer chips will continue the trend for more complexity than their predecessors. Many of them will contain different chip technologies and are termed SoC...
For present-day micro-electronic designs, it is becoming ever more important to accurately model substrate coupling effects. Basically, either a Finite Element Method (FEM) or a B...