Physical phenomena such as temperature have an increasingly important role in performance and reliability of modern process technologies. This trend will only strengthen with futu...
Rajarshi Mukherjee, Seda Ogrenci Memik, Gokhan Mem...
As the process technology enters the nanometer era, reliability has become a major concern in the design and manufacturing of VLSI circuits. In this paper we focus on one reliabil...
Since across-chip interconnect delays can exceed a clock cycle in nanometer technologies, it has become essential in high performance designs to add flip-flops on wires with multi...
Vidyasagar Nookala, Ying Chen, David J. Lilja, Sac...
This paper presents a parameterized soft core generator for the discrete Fourier transform (DFT). Reusable IPs of digital signal processing (DSP) kernels are important time-saving...
Grace Nordin, Peter A. Milder, James C. Hoe, Marku...
This paper presents a novel repeater insertion algorithm for the power minimization of realistic interconnect trees under given timing budgets. Our algorithm judiciously combines ...