This paper presents an inspection method of particle contamination for semiconductor reticles using continuous wavelet transform. Particle defect is considered as a singularity in...
This paper introduces a new Harris-affine corner detector algorithm, that does not need parameters to locate corners in images, given an observation scale. Standard detectors req...
Traditional techniques for statistical fMRI analysis are often based on thresholding of individual voxel values or averaging voxel values over a region of interest. In this paper w...
Scale and affine-invariant local features have shown excellent performance in image matching, object and texture recognition. This paper optimizes keypoint detection to achieve sta...
Many datasets can be described in the form of graphs or networks where nodes in the graph represent entities and edges represent relationships between pairs of entities. A common ...