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ASPDAC
2006
ACM
144views Hardware» more  ASPDAC 2006»
16 years 20 days ago
Compaction of pass/fail-based diagnostic test vectors for combinational and sequential circuits
Abstract— Substantial attention is being paid to the fault diagnosis problem in recent test literature. Yet, the compaction of test vectors for fault diagnosis is little explored...
Yoshinobu Higami, Kewal K. Saluja, Hiroshi Takahas...
ASPDAC
2006
ACM
100views Hardware» more  ASPDAC 2006»
16 years 20 days ago
Generation of shorter sequences for high resolution error diagnosis using sequential SAT
Commonly used pattern sources in simulation-based verification include random, guided random, or design verification patterns. Although these patterns may help bring the design ...
Sung-Jui (Song-Ra) Pan, Kwang-Ting Cheng, John Moo...
MOBICOM
2006
ACM
16 years 20 days ago
Localization in sparse networks using sweeps
Determining node positions is essential for many next-generation network functionalities. Previous localization algorithms lack correctness guarantees or require network density h...
David Kiyoshi Goldenberg, Pascal Bihler, Yang Rich...
MOBICOM
2006
ACM
16 years 20 days ago
Component based channel assignment in single radio, multi-channel ad hoc networks
In this paper, we consider the channel assignment problem in single radio multi-channel mobile ad-hoc networks. Specifically, we investigate the granularity of channel assignment...
Ramanuja Vedantham, Sandeep Kakumanu, Sriram Laksh...
APCSAC
2005
IEEE
16 years 10 days ago
The Challenges of Massive On-Chip Concurrency
Moore’s law describes the growth in on-chip transistor density, which doubles every 18 to 24 months and looks set to continue for at least a decade and possibly longer. This grow...
Kostas Bousias, Chris R. Jesshope
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