9842 search results - page 1441 / 1969 » The Complexity of the Matching-Cut Problem |
176
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ICCD
2008
IEEE
16 years 4 months ago
2008
IEEE
— The amount of time and resources that have to be spent on debugging of embedded cores continuously increases. Approaches valid 10 years ago can no longer be used due to the var...
199
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ICCD
2004
IEEE
16 years 4 months ago
2004
IEEE
A negative effect of ever-shrinking supply and threshold voltages is the larger percentage of total power consumption that comes from leakage current. Several techniques have been...
182
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ICCAD
2006
IEEE
16 years 4 months ago
2006
IEEE
The use of CMOS nanometer technologies at 65 nm and below will pose serious challenges on the design of mixed-signal integrated systems in the very near future. Rising design comp...
176
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ICCAD
2002
IEEE
16 years 4 months ago
2002
IEEE
For many years, CMOS process scaling has allowed a steady increase in the operating frequency and integration density of integrated circuits. Only recently, however, have we reach...
163
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ICCAD
2001
IEEE
16 years 4 months ago
2001
IEEE
In this work, we present an algorithm for simultaneous template generation and matching. The algorithm profiles the graph and iteratively contracts edges to create the templates. ...