Bias temperature instability, hot-carrier injection, and gate-oxide wearout will cause severe lifetime degradation in the performance and the reliability of future CMOS devices. Th...
Erika Gunadi, Abhishek A. Sinkar, Nam Sung Kim, Mi...
This study addresses the general problem of efficient resource management in wireless networks with arbitrary timevarying topologies. Communication channels are assumed to generall...
Software construction has typically drawn on engineering metaphors like building bridges or cathedrals, which emphasize architecture, specification, central planning, and determin...
David F. Bacon, Eric Bokelberg, Yiling Chen, Ian A...
This paper presents a bottom-up tracking algorithm for surveillance applications where speed and reliability in the case of multiple matches and occlusions are major concerns. The...
With network components increasingly reliable, routing is playing an ever greater role in determining network reliability. This has spurred much activity in improving routing stabi...