2877 search results - page 276 / 576 » The Complexity of Planarity Testing |
192
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TSMC
2008
15 years 6 months ago
2008
This correspondence presents an approach to the detection and isolation of component failures in large-scale systems. In the case of sensors that report at rates of 1 Hz or less, t...
157
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CPHYSICS
2004
15 years 6 months ago
2004
There has been dramatic progress in the scope and power of plasma simulations in recent years; and because codes are generally cheaper to write, to run and to diagnose than experi...
169
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COMCOM
2000
15 years 6 months ago
2000
ABSTRACT -- SPEC-VALUE, a rigorous scenario-driven approach for the description and validation of complex system functionalities at the early stages of design, is presented. It is ...
160
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CGF
1998
15 years 6 months ago
1998
In this paper, we present an e cient algorithm for contact determination between spline models. We make use of a new hierarchy, called ShellTree, that comprises of spherical shell...
185
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TVLSI
2002
15 years 6 months ago
2002
Circular built-in self-test (BIST) is a "test per clock" scheme that offers many advantages compared with conventional BIST approaches in terms of low area overhead, simp...