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EDOC
2006
IEEE
16 years 22 days ago
Exploring Intentional Modeling and Analysis for Enterprise Architecture
— An enterprise architecture is intended to be a comprehensive blueprint describing the key components and relationships for an enterprise from strategies to business processes t...
Eric S. K. Yu, Markus Strohmaier, Xiaoxue Deng
ESCIENCE
2006
IEEE
16 years 22 days ago
Managing Large-Scale Workflow Execution from Resource Provisioning to Provenance Tracking: The CyberShake Example
This paper discusses the process of building an environment where large-scale, complex, scientific analysis can be scheduled onto a heterogeneous collection of computational and s...
Ewa Deelman, Scott Callaghan, Edward Field, Hunter...
ETS
2006
IEEE
110views Hardware» more  ETS 2006»
16 years 22 days ago
Deterministic Logic BIST for Transition Fault Testing
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...
Valentin Gherman, Hans-Joachim Wunderlich, Jü...
GLOBECOM
2006
IEEE
16 years 22 days ago
Throughput Optimization for Continuous Flat Fading MIMO Channels with Estimation Error
— In this paper, we consider single user throughput optimization problem for continuous flat fading channels of multiple-input multiple-output (MIMO) system. It is known that ch...
Edward W. Jang, Younggeun Cho, John M. Cioffi
GLVLSI
2006
IEEE
101views VLSI» more  GLVLSI 2006»
16 years 22 days ago
Measurement and characterization of pattern dependent process variations of interconnect resistance, capacitance and inductance
Process variations have become a serious concern for nanometer technologies. The interconnect and device variations include interand intra-die variations of geometries, as well as...
Xiaoning Qi, Alex Gyure, Yansheng Luo, Sam C. Lo, ...