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DATE
2005
IEEE
110views Hardware» more  DATE 2005»
16 years 6 days ago
Rapid Generation of Thermal-Safe Test Schedules
Overheating has been acknowledged as a major issue in testing complex SOCs. Several power constrained system-level DFT solutions (power constrained test scheduling) have recently ...
Paul M. Rosinger, Bashir M. Al-Hashimi, Krishnendu...
DATE
2005
IEEE
117views Hardware» more  DATE 2005»
16 years 6 days ago
A Quality-of-Service Mechanism for Interconnection Networks in System-on-Chips
As Moore’s Law continues to fuel the ability to build ever increasingly complex system-on-chips (SoCs), achieving performance goals is rising as a critical challenge to completi...
Wolf-Dietrich Weber, Joe Chou, Ian Swarbrick, Drew...
154
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HICSS
2005
IEEE
173views Biometrics» more  HICSS 2005»
16 years 6 days ago
Implementing Rule-Based Monitors within a Framework for Continuous Requirements Monitoring
With the increasing complexity of information systems, it is becoming increasingly unclear as to how information system behaviors relate to stated requirements. Although requireme...
William N. Robinson
HPCA
2005
IEEE
16 years 6 days ago
Microarchitectural Wire Management for Performance and Power in Partitioned Architectures
Future high-performance billion-transistor processors are likely to employ partitioned architectures to achieve high clock speeds, high parallelism, low design complexity, and low...
Rajeev Balasubramonian, Naveen Muralimanohar, Kart...
ICCV
2005
IEEE
16 years 6 days ago
Using Extended Light Sources for Modeling Object Appearance under Varying Illumination
In this study, we demonstrate the effectiveness of using extended light sources for modeling the appearance of an object for varying illumination. Extended light sources have a ra...
Imari Sato, Takahiro Okabe, Yoichi Sato, Katsushi ...