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DAC
2006
ACM
16 years 7 months ago
Unknown-tolerance analysis and test-quality control for test response compaction using space compactors
For a space compactor, degradation of fault detection capability caused by the masking effects from unknown values is much more serious than that caused by error masking (i.e. ali...
Mango Chia-Tso Chao, Kwang-Ting Cheng, Seongmoon W...
ICCD
2005
IEEE
102views Hardware» more  ICCD 2005»
16 years 3 months ago
ChiYun Compact: A Novel Test Compaction Technique for Responses with Unknown Values
This paper proposes a response compactor, named ChiYun compactor, to compact scan-out responses in the presence of unknown values. By adding storage elements into an Xor network, ...
Mango Chia-Tso Chao, Seongmoon Wang, Srimat T. Cha...
DATE
2009
IEEE
112views Hardware» more  DATE 2009»
16 years 1 months ago
Package routability- and IR-drop-aware finger/pad assignment in chip-package co-design
—Due to increasing complexity of design interactions between the chip, package and PCB, it is essential to consider them at the same time. Specifically the finger/pad locations...
Chao-Hung Lu, Hung-Ming Chen, Chien-Nan Jimmy Liu,...
COLCOM
2008
IEEE
16 years 1 months ago
Defending against Attribute-Correlation Attacks in Privacy-Aware Information Brokering
Nowadays, increasing needs for information sharing arise due to extensive collaborations among organizations. Organizations desire to provide data access to their collaborators whi...
Fengjun Li, Bo Luo, Peng Liu, Anna Cinzia Squiccia...
ESCIENCE
2007
IEEE
16 years 1 months ago
Aneka: Next-Generation Enterprise Grid Platform for e-Science and e-Business Applications
In this paper, we present the design of Aneka, a .NET based service-oriented platform for desktop grid computing that provides: (i) a configurable service container hosting plugga...
Xingchen Chu, Krishna Nadiminti, Chao Jin, Srikuma...